Yu Cheng, Illinois Institute of Technology, USA
Dario Pompili, Rutgers University, USA
Peng-Jun Wan, Illinois Institute of Technology, USA, wan@iit.edu
Zhangyu Guan, University at Buffalo, USA, guan@buffalo.edu
Marco Di Felice, University of Bologna, Italy, difelice@cs.unibo.it
Xianghui Cao, Southeast University, China, xh.cao@ieee.org
Jian Ren, Michigan State University, USA, renjian@msu.edu
Shui Yu, University of Technology Sydney, Australia, shui.yu@uts.edu.au
Marco Levorato, University of California, Irvine, USA, levorato@uci.edu
Jun Luo, Nanyang Technological University, Singapore, junluo@ntu.edu.sg
Claudio Cicconetti, IIT-CNR, Italy, claudio.cicconetti@iit.cnr.it
Jelena Mišić, Toronto Metropolitan University, Canada, jmisic@torontomu.ca